Items where Author is "Geetha, Bhavani Gnanasambandam"

Article

Vinotha, Thangavel and Geetha, Bhavani Gnanasambandam (2026) Leveraging Fine-Grained Deep Convolutional Neural Network for Automated Wafer Map Defect Detection and Classification in Semiconductor Manufacturing. Traitement du Signal, 43 (3). pp. 1185-1198. ISSN 07650019